IJSTE

CALL FOR PAPERS : Aug 2019

Submission Last Date
25-Aug-19
Submit Manuscript Online

FOR AUTHORS

FOR REVIEWERS

ARCHIEVES

DOWNLOADS

Open Access



CopyScape
Creative Commons License

Delay Estimation of Fast Test Pattern Generator (TPG) using Ausim L 2.3


Author(s):

G. Naveen Balaji , SNS College of Technology, Coimbatore - 35; P. Malini, SNS College of Technology, Coimbatore - 35; T. Poovika, SNS College of Technology, Coimbatore - 35; P. Shanmugavadivu, SNS College of Technology, Coimbatore - 35; I. Rinisha Prem Priya, SNS College of Technology, Coimbatore - 35

Keywords:

Linear Feedback Shift Register (LFSR), Test Pattern Generator (TPG), gate delay, propagation delay, AUSIM L2.3

Abstract:

This paper attempts to show the survey on Test pattern generator (TPG) of a 28bit LFSR with Gate delay, propagation delay, and total number of gates are listed. The circuits were built in .asl file and simulated using AUSIM L2.3. The operation of digital logic simulator called the Auburn University Simulator (AUSIM) is described. The AUSIM version L2.3 besides providing simulation of non-hierarchial circuit descriptions it also provides area and performance audits of the cell.


Other Details:

Manuscript Id :IJSTEV4I9052
Published in :Volume : 4, Issue : 9
Publication Date: 01/04/2018
Page(s): 206-212
Download Article

IMPACT FACTOR

4.753

NEWS & UPDATES

Submit Article

Dear Authors, You can submit your article to our journal at the following link: http://www.ijste.org/Submit

Impact Factor

The Impact Factor of our Journal is 4.753 (Year - 2016)
3.905 (Year - 2015) 2.895(Year -2014)

Click Here

Submit Payment Online

Dear Authors, Now you can submit the payment receipt to our journal online at the following link: index.php?p=Payment

Index Copernicus Value

The IC Value of our journal is 69.90
Click Here

GLOBAL INDEXING



















Computer Science Directory. We are listed under Computer Research Institutes category

Share on Social media

Home | Privacy Policy | Terms & Conditions | Refund Policy | Feedback | Contact Us
Copyright © 2014 ijste.org All rights reserved