IJSTE

CALL FOR PAPERS : Nov 2017

Submission Last Date
25-Nov--17
Submit Manuscript Online

FOR AUTHORS

FOR REVIEWERS

ARCHIEVES

DOWNLOADS

Open Access



CopyScape
Creative Commons License

Applicability of Lean Principles for Testing Laboratories


Author(s):

Vijayshri Mahobiya , G.H.Raisoni College of Engineering ; S. B. Jaju, G.H.Raisoni College of Engineering ; D. J. Tidke, G.H.Raisoni College of Engineering

Keywords:

Lean Manufacturing, Testing Laboratories

Abstract:

The introduction of lean principles is a common approach for organizations seeking to improve quality, lower cost, and shorten time to market. This paper is refers to the study undertaken to evaluate the development of lean manufacturing model for performance improvement of testing laboratories. The management Philosophy and tools of lean production come from the manufacturing Industry, where they were pioneered by Toyota Motor Corporation, which is viewed as the leader in utilizing these performance improvement methods. Lean has already enjoyed tremendous success in improving quality and efficiency in both the manufacturing and the service sector industries.


Other Details:

Manuscript Id :IJSTEV3I6095
Published in :Volume : 3, Issue : 6
Publication Date: 01/01/2017
Page(s): 276-279
Download Article

IMPACT FACTOR

3.905

NEWS & UPDATES

Submit Article

Dear Authors, You can submit your article to our journal at the following link: http://www.ijste.org/Submit

Impact Factor

The Impact Factor of our Journal is 4.753 (Year - 2016)
3.905 (Year - 2015) 2.895(Year -2014)

Click Here

Submit Payment Online

Dear Authors, Now you can submit the payment receipt to our journal online at the following link: index.php?p=Payment

Index Copernicus Value

The IC Value of our journal is 69.90
Click Here

GLOBAL INDEXING



















Computer Science Directory. We are listed under Computer Research Institutes category

Share on Social media

Home | Privacy Policy | Terms & Conditions | Refund Policy | Feedback | Contact Us
Copyright © 2014 ijste.org All rights reserved