Design of a Tampering Localization Technique in Image Forensics

Author(s):

Priyadarshini S , K.L.N. College of Engineering; Dr. S. Miruna Joe Amali, K.L.N. College of Engineering

Keywords:

Digital Image Forensics, Precision, Random walk, Tampering

Abstract:

A Digital image is a two dimensional numeric representation. They are composed of picture elements called pixels, and of it represent the intensity information at a single point in the image. Thus digital images with such a massive data are mostly prone to attacks and forgeries. The term tampering or image forgery relates to the image modification by adding or removing certain regions in the image. This easy-to-tamper target i.e. the digital images are modified for various intentions, mostly for illegal activities. Analysis and investigation of this process is the Digital Image Forensics (DIF). Detecting and localizing such tampering in digital images are posing a great challenge and to face it, an effective method is proposed. With the widespread usage of digital images in storage and transfer of visual information, vulnerabilities against them are also increasing. MERW, Maximal Entropy Random Walk, method is taken for conforming to the aforementioned analysis. The input images are initially over segmented using the SLIC algorithm, Simple Linear Iterative Clustering. Features are extracted from each blocks based on Scale Invariant feature extraction algorithm (SIFT). From the extracted features the forgery is detected based on MERW method, applied in co-alliance with the block matching and labeled feature point matching. The performance of the process is measured with the help of values of Precision, Recall and F-Measure related to the input image.

Other Details:

Manuscript Id	:	IJSTEV3I10189
Published in	:	Volume : 3, Issue : 10
Publication Date	:	01/05/2017
Page(s)	:	379-383

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